MOS Source Code
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#include <mos/mos_global.h>
#include <mos/types.h>
#include <mos_stdio.h>
#include <mos_string.h>
#include <stdbool.h>
Go to the source code of this file.
Classes | |
struct | mos_test_result_t |
struct | mos_test_func_t |
Macros | |
#define | mos_test_log(level, symbol, format, ...) |
#define | mos_test_log_cont(level, format, ...) |
#define | MOS_TEST_DEFINE_CONDITION(condition, message) |
#define | MOS_TEST_CONDITIONAL(cond) |
#define | MOS_TEST_SKIP() |
#define | MOS_TEST_CASE(_TestName) |
#define | MOS_TEST_DECL_PTEST(_PTestName, ptest_args_printf_format, ...) |
#define | MOS_TEST_PTEST_INSTANCE(_PTestName, ...) |
#define | MOS_TEST_EXPECT_WARNING_N(N, body, msg) |
#define | MOS_TEST_EXPECT_WARNING(body, msg) |
#define | MOS_TEST_FAIL(format, ...) |
#define | MOS_TEST_ASSERT(condition, format, ...) |
#define | MOS_TEST_CHECK(actual, expected) |
#define | MOS_TEST_CHECK_STRING(actual, expected) |
#define | MOS_TEST_CHECK_STRING_N(actual, expected, n) |
#define | MOS_TEST_CHECK_EPS(actual, expected, epsilon) |
#define | MOS_TEST_CHECK_ARRAY(actual, expected, elements) |
#define | MOS_TEST_CHECK_ARRAY_EPS(actual, expected, elements, epsilon) |
#define | _MT_RUN_TEST_AND_PRINT_RESULT(_ResultVar, _TestFunc) |
#define | _MT_FLOATABS(a) |
#define | MOS_TEST_CURRENT_TEST_SKIPPED (*_mt_test_skipped) |
#define | _MT_WRAP_TEST_NAME(test_name) |
#define | _MT_PTEST_ARG_FORMAT(ptest_name) |
#define | _MT_PTEST_CALLER(ptest_name) |
#define | _MT_WRAP_PTEST_CALLER(ptest_name) |
#define | _MT_REGISTER_TEST_CASE(_TName, _TFunc) |
#define | MOS_TEST_FOREACH_TEST_CASE(_FPtr) |
Variables | |
s32 | test_engine_n_warning_expected |
const mos_test_func_t | __MOS_TEST_CASES_START [] |
const mos_test_func_t | __MOS_TEST_CASES_END [] |
#define mos_test_log | ( | level, | |
symbol, | |||
format, | |||
... ) |
Definition at line 14 of file test_engine_impl.h.
#define mos_test_log_cont | ( | level, | |
format, | |||
... ) |
Definition at line 25 of file test_engine_impl.h.
#define MOS_TEST_DEFINE_CONDITION | ( | condition, | |
message ) |
Definition at line 34 of file test_engine_impl.h.
#define MOS_TEST_CONDITIONAL | ( | cond | ) |
Definition at line 38 of file test_engine_impl.h.
Referenced by MOS_TEST_CASE().
#define MOS_TEST_SKIP | ( | ) |
Definition at line 45 of file test_engine_impl.h.
#define MOS_TEST_CASE | ( | _TestName | ) |
Definition at line 52 of file test_engine_impl.h.
#define MOS_TEST_DECL_PTEST | ( | _PTestName, | |
ptest_args_printf_format, | |||
... ) |
Definition at line 62 of file test_engine_impl.h.
#define MOS_TEST_PTEST_INSTANCE | ( | _PTestName, | |
... ) |
Definition at line 66 of file test_engine_impl.h.
#define MOS_TEST_EXPECT_WARNING_N | ( | N, | |
body, | |||
msg ) |
Definition at line 81 of file test_engine_impl.h.
Referenced by MOS_TEST_CASE().
#define MOS_TEST_EXPECT_WARNING | ( | body, | |
msg ) |
Definition at line 95 of file test_engine_impl.h.
Referenced by MOS_TEST_CASE(), MOS_TEST_CASE(), and MOS_TEST_CASE().
#define MOS_TEST_FAIL | ( | format, | |
... ) |
Definition at line 103 of file test_engine_impl.h.
#define MOS_TEST_ASSERT | ( | condition, | |
format, | |||
... ) |
Definition at line 118 of file test_engine_impl.h.
Referenced by __mos_test_wrapped_test_kmalloc_a_lot(), __mos_test_wrapped_test_kmalloc_large(), __mos_test_wrapped_test_kmalloc_single(), __mos_test_wrapped_test_kmalloc_stress(), and MOS_TEST_DECL_PTEST().
#define MOS_TEST_CHECK | ( | actual, | |
expected ) |
Definition at line 138 of file test_engine_impl.h.
Referenced by __mos_test_wrapped_test_hashmap_foreach_function(), __mos_test_wrapped_test_hashmap_get_function(), __mos_test_wrapped_test_hashmap_init_simple_macro(), __mos_test_wrapped_test_hashmap_put_multiple(), __mos_test_wrapped_test_hashmap_put_overflow(), __mos_test_wrapped_test_hashmap_put_single(), __mos_test_wrapped_test_hashmap_remove_function(), __mos_test_wrapped_test_multi_args_with_multiple_options(), __mos_test_wrapped_test_one_arg_with_an_option(), __mos_test_wrapped_test_one_arg_with_multiple_options(), __mos_test_wrapped_test_quotation_with_escaped_quotation_marks(), __mos_test_wrapped_test_quoted_args(), __mos_test_wrapped_test_quoted_args_with_spaces(), __mos_test_wrapped_test_quoted_args_with_spaces_and_commas(), __mos_test_wrapped_test_quoted_args_with_spaces_and_commas_and_equals(), __mos_test_wrapped_test_simple_cmdline(), __mos_test_wrapped_test_stack_init_deinit(), __mos_test_wrapped_test_stack_push_pop_stack(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), MOS_TEST_CASE(), and MOS_TEST_CASE().
#define MOS_TEST_CHECK_STRING | ( | actual, | |
expected ) |
Definition at line 158 of file test_engine_impl.h.
Referenced by __mos_test_wrapped_test_hashmap_get_function(), __mos_test_wrapped_test_hashmap_put_multiple(), __mos_test_wrapped_test_hashmap_put_overflow(), __mos_test_wrapped_test_hashmap_put_single(), __mos_test_wrapped_test_hashmap_remove_function(), __mos_test_wrapped_test_multi_args_with_multiple_options(), __mos_test_wrapped_test_one_arg_with_an_option(), __mos_test_wrapped_test_one_arg_with_multiple_options(), __mos_test_wrapped_test_quotation_with_escaped_quotation_marks(), __mos_test_wrapped_test_quoted_args(), __mos_test_wrapped_test_quoted_args_with_spaces(), __mos_test_wrapped_test_quoted_args_with_spaces_and_commas(), __mos_test_wrapped_test_quoted_args_with_spaces_and_commas_and_equals(), __mos_test_wrapped_test_simple_cmdline(), and MOS_TEST_CASE().
#define MOS_TEST_CHECK_STRING_N | ( | actual, | |
expected, | |||
n ) |
Definition at line 179 of file test_engine_impl.h.
Referenced by MOS_TEST_CASE().
#define MOS_TEST_CHECK_EPS | ( | actual, | |
expected, | |||
epsilon ) |
Definition at line 200 of file test_engine_impl.h.
#define MOS_TEST_CHECK_ARRAY | ( | actual, | |
expected, | |||
elements ) |
Definition at line 222 of file test_engine_impl.h.
#define MOS_TEST_CHECK_ARRAY_EPS | ( | actual, | |
expected, | |||
elements, | |||
epsilon ) |
Definition at line 251 of file test_engine_impl.h.
#define _MT_RUN_TEST_AND_PRINT_RESULT | ( | _ResultVar, | |
_TestFunc ) |
Definition at line 270 of file test_engine_impl.h.
#define _MT_FLOATABS | ( | a | ) |
Definition at line 289 of file test_engine_impl.h.
#define MOS_TEST_CURRENT_TEST_SKIPPED (*_mt_test_skipped) |
Definition at line 291 of file test_engine_impl.h.
#define _MT_WRAP_TEST_NAME | ( | test_name | ) |
Definition at line 294 of file test_engine_impl.h.
#define _MT_PTEST_ARG_FORMAT | ( | ptest_name | ) |
Definition at line 297 of file test_engine_impl.h.
#define _MT_PTEST_CALLER | ( | ptest_name | ) |
Definition at line 298 of file test_engine_impl.h.
#define _MT_WRAP_PTEST_CALLER | ( | ptest_name | ) |
Definition at line 299 of file test_engine_impl.h.
#define _MT_REGISTER_TEST_CASE | ( | _TName, | |
_TFunc ) |
Definition at line 308 of file test_engine_impl.h.
#define MOS_TEST_FOREACH_TEST_CASE | ( | _FPtr | ) |
Definition at line 309 of file test_engine_impl.h.
Referenced by mos_test_engine_run_tests().
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extern |
Definition at line 15 of file test_engine.c.
Referenced by test_engine_warning_handler().
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